ARISAWA Mfg.Co.,Ltd
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ANALYSIS SERVICE

Analysis Service Menu(Case Example)
ISO/IEC 17025 Accredited Laboratories
Analytical Equipments

Analysis Service Menu(Case Example)

Arisawa has accumulated a wealth of experience and know-how on various analysis techniques that we own as a material manufacturing company. Additionally, we are accredited and certified by ISO/IEC 17025 as a competence of testing and calibration laboratory. The analytical results on the basis of accredited range can carry the certified symbol. Arisawa analytical experts provide individual services with customized solutions. Please contact to our analytical support team, if you need any help.

Analysis service menu

Thermal analysis Analysis of material properties in change with temperature.
Surface observation Observation and measurement of the material surface profile.
Analysis of foreign matters Qualitative analysis of microscopic object.
Structure/layer analysis Available on organic or inorganic materials.
Quantitative analysis Halogen free analysis, as one of technique we own, is accredited by ISO/IEC 17025
as a competence of testing and calibration laboratory.

Case Example

Typical analytical techniques we can offer.

Thermal analysis

Analysis of glass-transition
temperature (Tg) byDMA*)

*) DMA=Dynamic Mechanical Analysis

A measuring example of polymer resin sheet by Dynamic Mechanical Analysis (DMA), which measures glass-transition temperature (Tg), storage elastic modulus and loss elastic modulus of a polymer resin material.


Measurement of linear expansion coefficient by TMA*)

*) TMA=Thermo-Mechanical Analysis

A measurement sample of polymer resin sheet by Thermo-Mechanical Analysis (TMA). The linear expansion coefficient is calculated from the slope of measurement graph, and the glass-transition temperature (Tg) is calculated from intersection point of tangential lines.


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Surface observation

Surface observation by SEM*)

 *) SEM=Scanning Electron Microscope

An observation of the specimen surface with emitted beam of electrons. The intended surface images is obtained by optimizing its magnification and tilt of the specimen.


Measurement of surface profiling by Laser Microscope

Obtaining surface profile images by emitting laser beam on the specimen surface where a level of high-resolution microscope is required. Measurement of such as scratch depth on film is also available.


Surface roughness observation by White light interference microscope

Obtaining surface topography by using a reference mirror internal to the microscope objective to cause interference between a reference light signal and the light reflected from the sample surface.
Able to perform contactless surface roughness analysis.
(Sa: Arithmetic mean height Sz: Maximum height)


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Analysis of foreign matters

Collecting specimen of 10μm in diameter by Electric Micro Manipulator

Collecting microscopic objects with manipulating 2 joysticks by PC mouse control while monitoring display.
The collected/isolated microscopic is qualitatively analyzed by EDX and IR analysis.


Elemental analysis by EDX*) measurement and analysis

*) EDX=Energy Dispersive X-ray spectrometer

An equipment for elemental analysis mounting in SEM and FE-SEM that can analyze micro region and elements composed on the surface (mainly inorganic object) by magnified observation on objective area.


Qualitative analysis by FT-IR*) measurement and testing

*) FT-IR=Fourier transform Infrared spectrum photometer

A structural analysis by emitting infrared to the specimen. Qualitative analysis, mainly for organic substance, of such as foreign object with optimum method (reflection or transmission method) to meet requirement and the nature of specimen.


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Structure/layer analysis

Ultrathin section prepared by ultra microtome

↓

Structural analysis by transmission image

An extremely thin section of material is prepared with use of a diamond knife. An image of the section in transmission light is observed by FE-SEM to identify the structure of specimen. -> The analysis result example on the laminated film specimen.


Specimen of sections prepared by ion beam (with non-mechanical stress)

↓

Structual analysis by transmission image

A specimen of section is prepared with use of ion beam. The specimen can be cut without stress due to no use of a knife. A section image in the reflective or transmission light is observed by FE-SEM to identify structure of sepecimen.


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Quantitative analysis

Outgas analysis by GC/MS*)

*) Gas chromatography–mass spectrometry (GC-MS)

The graph on the left is one of the example of outgas analysis by applying heat treatment on a sample having high molecule.
Qualitative and quantitative determination by MS spectrum of each peaks and Chromatographic peak areas.

For quantitative analysis, semiquantitative evaluation by GCMS analysis of n-Hexadecane


Quantitive analysis for sugar by LC/MS*)

*) Liquid chromatography–mass spectrometry (LC-MS)

Ex.) Suger analysis of Lettuce extract.
The graph on the left is one of the example of sugar analysis by LC/RI ( Liquid chromatography-refractive index detector) using polymer-based amino column.


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ARISAWA Mfg.Co.,Ltd
Top Page
Technologies & Products
Technologies & Products
  • FPC Materials

    Coverlay

    Copper Clad Laminate

    Adhesive sheet

    Others

  • Optical Materials

    Projection Screen

    UV Nanoimprinting

    3D Product

    Optical retardation element

    Lamination process-Film lamination

    Lamination process-Glass lamination

  • Electrical Insulating / Industrial Structural Materials

    Fabric Products

    General Coating Products

    Industrial Structural Materials

  • Thechnology

    Weaving

    Coating

    Molding

  • Glossary
  • Products News
  • Technologies & Products
Analysis service
Analysis service
  • Analysis service menu (Case Example)

    ISO/IEC17025 Accredited Laboratory

    Analytical Equipments

       
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    Organization chart

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Sustainability
  • Sustainability Management

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News List
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  • CONTACTS
Arisawa Mfg. Co., Ltd.

Head Office

Minami-honcho 1-5-5, Joetsu-shi, Niigata-ken

TEL:+81-(0)25-524-5121/FAX:+81-(0)25-524-1117

© Arisawa Manufacturing Co., Ltd.